Components
Image recognition system SEARCHROID
- Automatic recognition of micro products possible -
General Outline
Image recognition system enables position detection of micro products, detection of foreign particles on substrates, wafers, orientation flats and notches.
Features / Options
- The shift amount between the imaging target and the reference point is detected, and the X and Y stages are controlled to correct the shift amount.
- An abnormality is detected by comparing the imaging target with the sample image.
Applications
Alignment of contact for micro products
Detection of product misalignment in tray
Detection of foreign matter in wafer, orientation flat / notch
*For the improvement of product, please understand that the specifications are subject to change without prior notice.
**This product may be applicable to export control products such as strategic raw materials which are regulated by the Foreign Exchange and Foreign Trade Control Law.
Accordingly when you bring out the applicable products outside Japan. You should take a necessary action such as application of an export permit to the Government of Japan.
